A method for inspecting double-sided high-sloped structured surfaces based on dual-probe wavelength scanning interferometer

نویسندگان

  • Tao Zhang
  • Feng Gao
  • Xiangqian Jiang
چکیده

Double-sided high-sloped structured surfaces such as V-groove surfaces and Fresnel lenses are widely used in optical fibre positioning, retro-reflection, grating, light guiding and light concentration for solar power installation. Both the surface finish as well as the dimensions of the structured surfaces play important roles in the quality of the final products. Numerous efforts have been put into the study of characterisation of these types of surfaces. However, only part of the parameters can be acquired and analyzed. It is still impossible to measure and generate the whole topography of these types of structured surfaces. This results in the manufacturing process suffering from high scrap rates. In this paper, an orthogonally placed dual probing system based on Wavelength Scanning Interferometry (WSI) aiming to measure the whole topography of the double-sided high-sloped structured surfaces simultaneously is presented. Each of the probes form an interferometer, and measures the facets of the double-sided high-sloped surfaces in one direction and acquires part of the topography. The whole topography is then stitched together using the two datasets based on the relationship between the coordinate systems of the two probes. The relationship between the two probes is acquired through the calibration of a specially designed 3D artefact. The artefact contains geometric features on each of the facets and is calibrated by a combination of several measurement methods to establish the space coordinates of the features. By matching the corresponding features on the measurement results acquired with each of the probes of the new setup to the reference topography using a 3D registration algorithm such as ICP (Iterative Closest Points) and its variants, the relationship between the coordinate system of each probe and the coordinate system of the reference topography can be calculated. Then the relationship between the coordinate systems of 2 probes can be determined, which can then be used to stitch the whole topography. The setup and the math model has been built and some initial results have been acquired.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Surface topography acquisition method for double-sided near-right-angle structured surfaces based on dual-probe wavelength scanning interferometry.

This paper proposes an approach to measure double-sided near-right-angle structured surfaces based on dual-probe wavelength scanning interferometry (DPWSI). The principle and mathematical model is discussed and the measurement system is calibrated with a combination of standard step-height samples for both probes vertical calibrations and a specially designed calibration artefact for building u...

متن کامل

Rapid phase-shifting fiber interferometer with optical stylus.

Optical fiber interferometry holds many advantages for the online measurement of high-precision surfaces. Here, a fiber interferometer with a wavelength-scanning probe is reported. Such an interferometer requires active stabilization against the effects of temperature drift and vibration. A method of multiplexing dual wavelengths into the same fiber, combined with rapid phase shifting and real-...

متن کامل

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

An Intelligent Non-Trial-and-Error Design Method for Double Screen Frequency Selective Surfaces

An intelligent design method of double screen frequency selective surfaces (FSSs) is addressed in this paper. The employed unit cell is composed of two metallic screens, which are printed on both sides of a substrate. The presented non-trial-and-error approach is investigated based on the separate design of each screen. With the help of some physical intuition and an equivalent circuit model, i...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2017